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Last edited anonymously
April 30, 2008 | History
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Wolfgang Osten

We need a photo of Wolfgang Osten

29 works Add another?

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  • Cover of: Optical inspection of microsystems

    First published in 2006 6 editions in 1 language — 1 previewable
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  • Cover of: Optical Inspection of Microsystems, Second Edition

    First published in 2019 5 editions in 1 language
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  • Cover of: Fringe 2013: 7th International Workshop on Advanced Optical Imaging and Metrology

    First published in 2013 4 editions in 1 language
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  • Cover of: Fringe 2009: 6th International Workshop on Advanced Optical Metrology

    First published in 2009 4 editions in 1 language — 1 previewable
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  • Cover of: Optical Imaging and Metrology: Advanced Technologies

    First published in 2012 4 editions in 1 language
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  • Cover of: Fringe '89: proceedings of the 1. International Workshop on Automatic Processing of Fringe Patterns held in Berlin (GDR), April 25-28, 1989

    First published in 1989 3 editions in 1 language
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  • Cover of: Interferometry XIV.: 13-14 August 2008, San Diego, California, USA

    First published in 2008 3 editions in 1 language
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  • Cover of: Interferometry XIII.: 16-17 August, 2006, San Diego, California, USA

    First published in 2006 2 editions in 1 language
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  • Cover of: Fringe 2005: The 5th International Workshop on Automatic Processing of Finge Patterns

    First published in 2005 2 editions in 1 language — 1 previewable
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  • Cover of: Interferometry XI

    First published in 2002 2 editions in 1 language — 1 previewable
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  • Cover of: Simulation and Experiment in Laser Metrology: Proceedings of the International Symposium on Laser Applications in Precision Measurements held in Balatonfüred/Hungary, ... 3-6, 1996 (AKV Series in Optical Metrology)

    First published in 1996 1 edition in 1 language
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  • Cover of: Optical Inspection of Microsystems. Optical Science and Engineering

    First published in 2010 1 edition in 1 language
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  • Cover of: Fringe 2005: The 5th International Workshop on Automatic Processing of Finge Patterns

    First published in 2006 1 edition in 1 language
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  • Cover of: Holography and Speckle: A Review of 60 Successful Years

    First published in 2023 1 edition in 1 language
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  • Cover of: Optical measurement systems for industrial inspection VII: 23-26 May 2011, Munich, Germany

    First published in 2011 1 edition in 1 language
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  • Cover of: Optical metrology in production engineering: 27-30 April, 2004, Strasbourg, France

    First published in 2004 1 edition in 1 language — 1 previewable
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  • Cover of: Optical measurement systems for industrial inspection II: application in industrial design : 18-19 June, 2001, Munich, Germany

    First published in 2001 1 edition in 1 language — 1 previewable
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  • Cover of: Advanced photonic sensors and applications II: 27-30 November, 2001, Singapore

    First published in 2001 1 edition in 1 language — 1 previewable
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  • Cover of: Interferometry XII: applications : 4-5 August, 2004, Denver, Colorado, USA

    First published in 2004 1 edition in 1 language — 1 previewable
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  • Cover of: Optical measurement systems for industrial inspection III: 23-26 June 2003, Munich, Germany

    First published in 2003 1 edition in 1 language — 1 previewable
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We need a photo of Wolfgang Osten

Subjects
Congresses, Industrial applications, Optical detectors, Optical methods, Quality control, Interferometry, Optical instruments, Optical measurements, Measurement, Image processing, Data processing, Diffraction patterns, Engineering, Engineering inspection, Mensuration, Meteorology, Metrology, Microelectromechanical systems, Microscopy, Automatisation, Biosensors, Chemical processes, Chemistry, Computer vision, Contrôle

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ID Numbers

  • OLID: OL3164889A

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History

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April 30, 2008 Created by an anonymous user initial import