An edition of Failure analysis of electronic parts
(1975)
Failure analysis of electronic parts
laboratory methods
by Goddard Space Flight Center.
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Last edited by Open Library Bot
December 5, 2010 | History
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Publish Date
1975
Publisher
Scientific and Technical Information Office, National Aeronautics and Space Administration,
for sale by the National Technical Information Service
Language
English
Pages
79
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Subjects
Electronic apparatus and appliances, Testing| Edition | Availability |
|---|---|
1
Failure analysis of electronic parts: laboratory methods
1975, Scientific and Technical Information Office, National Aeronautics and Space Administration, for sale by the National Technical Information Service
in English
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| December 5, 2010 | Edited by Open Library Bot | Added subjects from MARC records. |
| December 10, 2009 | Created by WorkBot | add works page |